Atomic microscopy offers chemical ID
Date: 4.3.2007
Japanese scientists say they've discovered it is possible to use atomic force microscopy to identify the chemical makeup of individual surface atoms.
Atomic force microscopy works by measuring the short-range forces that occur between a tiny tip and the atoms on the surface of a sample, allowing the structure of that surface to be imaged with atomic resolution.....
Whole article: "www.sciencedaily.com":[ http://www.sciencedaily.com/upi/index.php?feed=Science&article=UPI-1-20070301-07545000-bc-japan-microscopy.xml]
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