Prague, Czech Republic (October 17-21, 2005)
October 17-21, 2005Prague, Czech RepublicMain topics: new trends in electron microscopy, electron optics, sources of electron, interaction of electrons with matter, detection of signal electrons in the scanning microscopy, environmental scanning microscopy, vacuum technique and technologies.
More: http://www.microscopy.cz/modules.php?op=read&name=Kalendar&cid=31
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